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Journal description
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Details for article 6 of 15 found articles
| Title: |
Detectability of two overlapping Pearson VII peaks in simulated X-ray diffraction patterns |
| Author: |
Van de Velde, H. Platbrood, G. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 18 (1985) nr. 2 pages 114-119 |
| Year: |
1985-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 15 found articles
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