include_once 'Zend/View/Helper/HeadMeta.php'; include_once 'Zend/View/Helper/HeadScript.php'; include_once 'Zend/View/Helper/HeadStyle.php'; include_once 'Zend/View/Helper/Translate.php'; include_once 'Zend/View/Helper/Url.php'; include_once 'Zend/View/Helper/Layout.php'; include_once 'Zend/Controller/Action/Helper/ViewRenderer.php'; include_once 'Zend/Filter/Word/CamelCaseToDash.php'; include_once 'Zend/Filter/StringToLower.php'; include_once 'Zend/View/Helper/Placeholder.php'; include_once 'Zend/View/Helper/HeadTitle.php'; include_once 'Zend/View/Helper/HeadLink.php'; IBL Tool - Digital Library
  Digital Library
Close Browse articles from a journal
 
Search for with title:
ABCDEFGHIJKLMNOPQRSTUVWXYZ

 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 8 of 10 found articles
 
 
  Quantitative X-ray phase analysis of surface layers
 
 
Title: Quantitative X-ray phase analysis of surface layers
Author: Zevin, L. S.
Rozenak, P.
Eliezer, D.
Appeared in: Journal of applied crystallography
Paging: Volume 17 (1984) nr. 1 pages 18-21
Year: 1984-02-01
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 10 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands