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Journal description
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Details for article 6 of 32 found articles
| Title: |
An absolute intensity standard for small-angle X-ray scattering measured with position-sensitive detectors |
| Author: |
Russell, T. P. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 16 (1983) nr. 5 pages 473-478 |
| Year: |
1983-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 32 found articles
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