|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 27 of 32 found articles
| Title: |
Precision interplanar spacing measurements of boron-doped silicon |
| Author: |
Soares, D. A. W. Pimentel, C. A. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 16 (1983) nr. 5 pages 486-492 |
| Year: |
1983-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 27 of 32 found articles
| << previous | next >> |