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                                       Details for article 9 of 39 found articles
 
 
  Asymmetric X-ray Bragg reflexion and shallow strain distribution in silicon single crystals
 
 
Title: Asymmetric X-ray Bragg reflexion and shallow strain distribution in silicon single crystals
Author: Fukuhara, A.
Takano, Y.
Appeared in: Journal of applied crystallography
Paging: Volume 10 (1977) nr. 4 pages 287-290
Year: 1977-08-01
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 39 found articles
 
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