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                                       Details for article 13 of 25 found articles
 
 
  Logistic Regression with Exposure Biomarkers and Flexible Measurement Error
 
 
Title: Logistic Regression with Exposure Biomarkers and Flexible Measurement Error
Author: Sugar, Elizabeth A.
Wang, Ching-Yun
Prentice, Ross L.
Appeared in: Biometrics
Paging: Volume 63 (2007) nr. 1 pages 143-151
Year: 2007-03
Contents:
Publisher: Blackwell Publishing Inc, Malden, USA
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 13 of 25 found articles
 
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