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Journal description
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Details for article 16 of 35 found articles
| Title: |
EEMNet: an end-to-end efficient model for PCB surface tiny defect detection |
| Author: |
Wu, Yuxiang Zheng, Liming Chen, Enze |
| Appeared in: |
International journal of machine learning and cybernetics |
| Paging: | Volume 15 () nr. 12 pages 5579-5594 |
| Year: |
2024-06-21 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 35 found articles
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