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Simultaneous microwave characterization of wafer-level optoelectronic transceiver chips based on photonic sampling and mapping |
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Titel: |
Simultaneous microwave characterization of wafer-level optoelectronic transceiver chips based on photonic sampling and mapping |
Auteur: |
He, Yutong Zou, Xinhai Xu, Ying Li, Zhihui Cui, Naidi Feng, Junbo Zhang, Yali Zhang, Zhiyao Zhang, Shangjian Liu, Yong Zhu, Ninghua |
Verschenen in: |
Science China information sciences |
Paginering: |
Jaargang 67 () nr. 2 pagina's xx |
Jaar: |
2024-01-25 |
Inhoud: |
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Uitgever: |
Science China Press, Beijing |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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