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                                       Details for article 3 of 28 found articles
 
 
  Characterization of a Stressed Passive Film Using Scanning Electrochemical Microscope and Point Defect Model
 
 
Title: Characterization of a Stressed Passive Film Using Scanning Electrochemical Microscope and Point Defect Model
Author: Gao, Zhi-Ming
Wang, Can
Miao, Wei-Hang
Zhu, Renkang
Xia, Da-Hai
Appeared in: Transactions of the Indian Institute of Metals
Paging: Volume 70 (2016) nr. 5 pages 1337-1347
Year: 2016
Contents:
Publisher: Springer India, New Delhi
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 28 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands