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Journal description
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Details for article 5 of 6 found articles
| Title: |
Interferometric Measurement of Thickness of Isolated Transparent Films |
| Author: |
Saha, Satadal Bhattacharya, Kallol |
| Appeared in: |
Journal of optics |
| Paging: | Volume 29 (2000) nr. 1 pages 25-34 |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Springer India, New Delhi |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 6 found articles
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