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Journal description
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Details for article 4 of 10 found articles
| Title: |
Correction: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions |
| Author: |
Deenen, Patrick C. Middelhuis, Jeroen Akcay, Alp Adan, Ivo J. B. F. |
| Appeared in: |
Flexible services and manufacturing journal |
| Paging: | Volume 36 () nr. 2 pages 597-598 |
| Year: |
2023-08-01 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 10 found articles
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