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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 5 of 8 found articles
| Title: |
On the Fracture Toughness Measurement of Thin Film Coated Silicon Wafers |
| Author: |
Yang, Chris Pham, John |
| Appeared in: |
SILICON |
| Paging: | Volume 7 (2014) nr. 1 pages 27-30 |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 8 found articles
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