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                                       Details for article 3 of 41 found articles
 
 
  A Simulation Study of the Effect of Trap Charges and Temperature on Performance of Dual Metal Strip Double Gate TFET
 
 
Title: A Simulation Study of the Effect of Trap Charges and Temperature on Performance of Dual Metal Strip Double Gate TFET
Author: Nikhil, Korra
Babu, K Murali Chandra
Talukdar, Jagritee
Goel, Ekta
Appeared in: SILICON
Paging: Volume 16 () nr. 2 pages 525-534
Year: 2023-09-29
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 41 found articles
 
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