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Journal description
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Details for article 2 of 20 found articles
| Title: |
Assessment of Trap Charges for Analog/RF FOMs and Linearity Behaviour on InAs Based Dual Metal Hetero Gate Oxide TFET for Enhanced Reliability |
| Author: |
Vedvrat, |
| Appeared in: |
SILICON |
| Paging: | Volume 16 () nr. 17 pages 6107-6121 |
| Year: |
2024-09-17 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 20 found articles
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