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Journal description
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Details for article 14 of 20 found articles
| Title: |
Microstructure Analysis of Silicon Nanowalls: Insights from Positron Beam Doppler Broadening Measurements |
| Author: |
Lakshmanan, C. Viswanath, R. N. Behera, Anil K. Ajikumar, P. K. Rajaraman, R. |
| Appeared in: |
SILICON |
| Paging: | Volume 16 () nr. 13-14 pages 5317-5325 |
| Year: |
2024-07-08 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 20 found articles
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