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Journal description
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Details for article 3 of 35 found articles
| Title: |
A Theoretical Performance and Reliability Investigation of a Vertical Hetero Oxide Based JL-TFET under Ideal Conditions |
| Author: |
Chandan, Bandi Venkata Dharmender, Nigam, Kaushal |
| Appeared in: |
SILICON |
| Paging: | Volume 16 () nr. 10 pages 4397-4413 |
| Year: |
2024-05-07 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 35 found articles
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