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Details for article 18 of 35 found articles
| Title: |
Fuzzy Logic Based Model to Predict Surface Roughness of Si(100) Wafer Using Preliminary Experimental Data Obtained From Single Pole Magnetic Abrasive Finishing Process |
| Author: |
Sharma, Ashwani Pandey, Kheelraj Sood, Anoop Kumar |
| Appeared in: |
SILICON |
| Paging: | Volume 16 () nr. 10 pages 4199-4212 |
| Year: |
2024-04-19 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 35 found articles
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