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Details for article 21 of 36 found articles
| Title: |
Investigating the Effect of Process Parameter on the Properties of Rf Sputtered pSi Thin Film by Taguchi and ANOVA Analysis |
| Author: |
Uchayash, Sajid Mahfuz Datta, Shamik Touhami, Ahmed Rahman, Al Mazedur Huq, Hasina F. |
| Appeared in: |
SILICON |
| Paging: | Volume 15 () nr. 5 pages 2323-2338 |
| Year: |
2022-10-26 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 36 found articles
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