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                                       Details for article 10 of 36 found articles
 
 
  Design and Performance Evaluation of a Novel Dual Tunneling based TFET Considering Trap Charges for Reliability Improvement
 
 
Title: Design and Performance Evaluation of a Novel Dual Tunneling based TFET Considering Trap Charges for Reliability Improvement
Author: Kwatra, Priyanka
Nigam, Kaushal
Singh, Sajai Vir
Appeared in: SILICON
Paging: Volume 15 () nr. 5 pages 2407-2425
Year: 2022-10-27
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 36 found articles
 
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