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                                       Details for article 9 of 39 found articles
 
 
  Correction to: Implementation of Band Gap and Gate Oxide Engineering to Improve the Electrical Performance of SiGe/InAs Charged Plasma-based Junctionless-TFET
 
 
Title: Correction to: Implementation of Band Gap and Gate Oxide Engineering to Improve the Electrical Performance of SiGe/InAs Charged Plasma-based Junctionless-TFET
Author: Kumar, Kaushal
Kumar, Ajay
Mishra, Varun
Sharma, Subhash Chandra
Appeared in: SILICON
Paging: Volume 15 () nr. 3 pages 1315
Year: 2022-09-24
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 39 found articles
 
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