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                                       Details for article 27 of 40 found articles
 
 
  Investigation of Single Event Transients on RingFET using 3D TCAD Simulations
 
 
Title: Investigation of Single Event Transients on RingFET using 3D TCAD Simulations
Author: Ramya, M.
Nagarajan, K. K.
Appeared in: SILICON
Paging: Volume 15 () nr. 2 pages 875-886
Year: 2022-08-17
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 27 of 40 found articles
 
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