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                                       Details for article 25 of 40 found articles
 
 
  Interface Trap Charges Analysis on DC and High Frequency Characteristics of UTBB-FDSOI FET
 
 
Title: Interface Trap Charges Analysis on DC and High Frequency Characteristics of UTBB-FDSOI FET
Author: Awadhiya, Bhaskar
Yadav, Shivendra
Acharya, Abhishek
Appeared in: SILICON
Paging: Volume 15 () nr. 2 pages 937-942
Year: 2022-08-24
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 25 of 40 found articles
 
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