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Details for article 32 of 35 found articles
| Title: |
The Investigation of Gate Oxide and Temperature Changes on Electrostatic and Analog/RF and Behaviour of Nanotube Junctionless Double-Gate-All Around (NJL-DGAA) MOSFETs using Si Nano-materials |
| Author: |
Gupta, Abhinav Pandey, Amit Kumar Upadhyay, Shipra Gupta, Vidyadhar Gupta, Tarun Kumar Pandey, Digvijay Bajpai, Shrish Chandel, Vishal Singh |
| Appeared in: |
SILICON |
| Paging: | Volume 15 () nr. 12 pages 5197-5208 |
| Year: |
2023-03-27 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 32 of 35 found articles
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