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Journal description
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Details for article 29 of 52 found articles
| Title: |
Impact of Gate Length and Doping Variation on the DC and Analog/RF Performance of sub - 3nm Stacked Si Gate-All-Around Nanosheet FET |
| Author: |
Yadav, Nisha Jadav, Sunil Saini, Gaurav |
| Appeared in: |
SILICON |
| Paging: | Volume 15 () nr. 1 pages 217-228 |
| Year: |
2022-07-14 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 52 found articles
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