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                                       Details for article 31 of 60 found articles
 
 
  Investigation and Design of Stacked Oxide Polarity Gate JLTFET in the Presence of Interface Trap Charges for Analog/RF Applications
 
 
Title: Investigation and Design of Stacked Oxide Polarity Gate JLTFET in the Presence of Interface Trap Charges for Analog/RF Applications
Author: Nigam, Kaushal
Singh, Sajai Vir
Kwatra, Priyanka
Appeared in: SILICON
Paging: Volume 14 () nr. 8 pages 3963-3980
Year: 2021-05-29
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 31 of 60 found articles
 
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