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  A Comprehensive Investigation of Vertically Stacked Silicon Nanosheet Field Effect Transistors: an Analog/RF Perspective
 
 
Title: A Comprehensive Investigation of Vertically Stacked Silicon Nanosheet Field Effect Transistors: an Analog/RF Perspective
Author: Tayal, Shubham
Ajayan, J.
Joseph, L. M. I. Leo
Tarunkumar, J.
Nirmal, D.
Jena, Biswajit
Nandi, Ashutosh
Appeared in: SILICON
Paging: Volume 14 () nr. 7 pages 3543-3550
Year: 2021-05-04
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 60 found articles
 
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