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                                       Details for article 67 of 80 found articles
 
 
  Simulation Analysis on Ferroelectric Tunneling Layer VTFET with Different Dielectric Constant for Linear and RF/Analog Parameters
 
 
Title: Simulation Analysis on Ferroelectric Tunneling Layer VTFET with Different Dielectric Constant for Linear and RF/Analog Parameters
Author: Singh, Shailendra
Appeared in: SILICON
Paging: Volume 14 () nr. 18 pages 12357-12370
Year: 2022-05-17
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 67 of 80 found articles
 
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