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Journal description
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Details for article 44 of 80 found articles
| Title: |
Investigation of Noise Characteristics in Gate-Source Overlap Tunnel Field-Effect Transistor |
| Author: |
Sinha, Sanjeet Kumar Chander, Sweta Chaudhary, Rekha |
| Appeared in: |
SILICON |
| Paging: | Volume 14 () nr. 16 pages 10661-10668 |
| Year: |
2022-03-12 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 44 of 80 found articles
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