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Journal description
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Details for article 53 of 80 found articles
| Title: |
Modeling Analysis and Geometric Investigation of SOI FinFET for RF/AF Parameters |
| Author: |
Srivastava, Nishant Mani, Prashant |
| Appeared in: |
SILICON |
| Paging: | Volume 14 () nr. 13 pages 8151-8159 |
| Year: |
2022-01-07 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 53 of 80 found articles
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