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Journal description
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Details for article 37 of 60 found articles
| Title: |
Nanoindentation Characterization of Single-Crystal Silicon with Oxide Film |
| Author: |
Yin, Lianmin Dai, Yifan Hu, Hao |
| Appeared in: |
SILICON |
| Paging: | Volume 14 () nr. 10 pages 5173-5178 |
| Year: |
2021-08-07 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 37 of 60 found articles
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