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                                       Details for article 17 of 35 found articles
 
 
  Impact of Device Geometrical Parameter Variation on RF Stability of SELBOX Inverted-T Junctionless FINFET
 
 
Title: Impact of Device Geometrical Parameter Variation on RF Stability of SELBOX Inverted-T Junctionless FINFET
Author: Raju, Veerati
PankajNelapati, Rajeev
Sivasankaran, K.
Appeared in: SILICON
Paging: Volume 13 () nr. 8 pages 2605-2617
Year: 2020-07-29
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 17 of 35 found articles
 
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