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                                       Details for article 16 of 25 found articles
 
 
  Linearity Performance Analysis Due to Lateral Straggle Variation in Hetero-Stacked TFET
 
 
Title: Linearity Performance Analysis Due to Lateral Straggle Variation in Hetero-Stacked TFET
Author: Vanlalawmpuia, K.
Bhowmick, Brinda
Appeared in: SILICON
Paging: Volume 12 () nr. 4 pages 955-961
Year: 2019-05-31
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 25 found articles
 
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