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                                       Details for article 6 of 51 found articles
 
 
  Dielectric Assessment of Epitaxially Grown Al/SiO2/Si Heterojunction
 
 
Title: Dielectric Assessment of Epitaxially Grown Al/SiO2/Si Heterojunction
Author: Ashery, A.
Elnasharty, Mohamed M. M.
Appeared in: SILICON
Paging: Volume 11 (2018) nr. 4 pages 1875-1883
Year: 2018
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 51 found articles
 
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