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                                       Details for article 40 of 51 found articles
 
 
  Study of Infra-red Spectroscopy on Bonding Environment and Structural Properties of Nanocrystalline Silicon Thin Films Grown by VHF-PECVD Process
 
 
Title: Study of Infra-red Spectroscopy on Bonding Environment and Structural Properties of Nanocrystalline Silicon Thin Films Grown by VHF-PECVD Process
Author: Juneja, Sucheta
Sharma, Mansi
Kumar, Sushil
Appeared in: SILICON
Paging: Volume 11 (2018) nr. 4 pages 1925-1937
Year: 2018
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 40 of 51 found articles
 
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