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                                       Details for article 26 of 60 found articles
 
 
  Influence of Annealing Temperature on Structural and dc Electrical Properties of SnO2 Thin Films for Schottky Barrier Diodes
 
 
Title: Influence of Annealing Temperature on Structural and dc Electrical Properties of SnO2 Thin Films for Schottky Barrier Diodes
Author: Ravikumar, K.
Agilan, S.
Muthukumarasamy, N.
Raja, M.
Lakshmanan, Raja
Ganesh, R.
Appeared in: SILICON
Paging: Volume 10 (2017) nr. 4 pages 1591-1599
Year: 2017
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 26 of 60 found articles
 
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