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Journal description
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Details for article 25 of 52 found articles
| Title: |
Local structural investigation of silicon surfaces by electron scattering |
| Author: |
Crescenzi, M. De Gunnella, R. Castrucci, P. Davoli, I. |
| Appeared in: |
Il nuovo cimento. D |
| Paging: | Volume 20 (1998) nr. 7-8 pages 991-998 |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Società Italiana di Fisica, Bologna |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 52 found articles
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