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                                       Details for article 18 of 61 found articles
 
 
  High-resolution X-ray diffraction of silicon at low temperatures
 
 
Title: High-resolution X-ray diffraction of silicon at low temperatures
Author: Lu, Z.
Munakata, K.
Kohno, A.
Soejima, Y.
Okazaki, A.
Appeared in: Il nuovo cimento. D
Paging: Volume 19 (1997) nr. 2-4 pages 305-311
Year: 1997
Contents:
Publisher: Società Italiana di Fisica, Bologna
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 18 of 61 found articles
 
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