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Ge δ layer in Si(100) characterized by X-ray reflectivity, grazing incidence diffraction and standing-wave measurements |
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Title: |
Ge δ layer in Si(100) characterized by X-ray reflectivity, grazing incidence diffraction and standing-wave measurements |
Author: |
Beck, U. Yang, P. Metzger, T. H. Peisl, J. Falta, J. Materlik, G. Rupp, T. Baumgärtner, H. Eisele, I. Patel, J. R. |
Appeared in: |
Il nuovo cimento. D |
Paging: |
Volume 19 (1997) nr. 2-4 pages 403-410 |
Year: |
1997 |
Contents: |
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Publisher: |
Società Italiana di Fisica, Bologna |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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