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                                       Details for article 11 of 61 found articles
 
 
  Ge δ layer in Si(100) characterized by X-ray reflectivity, grazing incidence diffraction and standing-wave measurements
 
 
Title: Ge δ layer in Si(100) characterized by X-ray reflectivity, grazing incidence diffraction and standing-wave measurements
Author: Beck, U.
Yang, P.
Metzger, T. H.
Peisl, J.
Falta, J.
Materlik, G.
Rupp, T.
Baumgärtner, H.
Eisele, I.
Patel, J. R.
Appeared in: Il nuovo cimento. D
Paging: Volume 19 (1997) nr. 2-4 pages 403-410
Year: 1997
Contents:
Publisher: Società Italiana di Fisica, Bologna
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 11 of 61 found articles
 
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