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Journal description
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Details for article 15 of 15 found articles
| Title: |
X-ray Diffraction Analysis of Damaged Layer During Polishing of Silicon Carbide |
| Author: |
Jung, Hokyoung Jeong, Seonho Park, Youngwook Shin, Yeongil Jeong, Haedo |
| Appeared in: |
International journal of precision engineering and manufacturing |
| Paging: | Volume 24 () nr. 1 pages 25-32 |
| Year: |
2022-11-02 |
| Contents: | |
| Publisher: |
Korean Society for Precision Engineering, Seoul |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 15 found articles
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