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Journal description
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Details for article 9 of 9 found articles
| Title: |
Thermographic Inspection of CLP Defects on the Subsurface Based on Binary Image |
| Author: |
Lee, Seungju Chung, Yoonjae Kim, Chunyoung Shrestha, Ranjit Kim, Wontae |
| Appeared in: |
International journal of precision engineering and manufacturing |
| Paging: | Volume 23 () nr. 3 pages 269-279 |
| Year: |
2022-01-31 |
| Contents: | |
| Publisher: |
Korean Society for Precision Engineering, Seoul |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 9 found articles
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