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Journal description
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Details for article 11 of 21 found articles
| Title: |
Fast and Reliable Measurement of Thin Film Thickness Profile Based on Wavelet Transform in Spectrally Resolved White-Light Interferometry |
| Author: |
Kim, Min-Gab Pahk, Heui-Jae |
| Appeared in: |
International journal of precision engineering and manufacturing |
| Paging: | Volume 19 (2018) nr. 2 pages 213-219 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Korean Society for Precision Engineering, Seoul |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 21 found articles
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