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                                       Details for article 6 of 22 found articles
 
 
  Characterization of atomic layer deposited and sputtered yttria-stabilized-zirconia thin films for low-temperature solid oxide fuel cells
 
 
Title: Characterization of atomic layer deposited and sputtered yttria-stabilized-zirconia thin films for low-temperature solid oxide fuel cells
Author: Tanveer, Waqas Hassan
Ji, Sanghoon
Yu, Wonjong
Cha, Suk Won
Appeared in: International journal of precision engineering and manufacturing
Paging: Volume 16 (2015) nr. 10 pages 2229-2234
Year: 2015
Contents:
Publisher: Korean Society for Precision Engineering, Seoul
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 22 found articles
 
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