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Journal description
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Details for article 1 of 25 found articles
| Title: |
A fast image enhancement technique using a new scanning path for critical dimension measurement of glass panels |
| Author: |
Doan, Nam-Thai Moon, Jun-Hee Kim, Tai-Wook Pahk, Heui-Jae |
| Appeared in: |
International journal of precision engineering and manufacturing |
| Paging: | Volume 13 (2012) nr. 12 pages 2109-2114 |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Korean Society for Precision Engineering, Springer |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 25 found articles
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