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                                       Details for article 17 of 17 found articles
 
 
  Transmission electron microscopy observation of a single Ni dot fabricated using scanning tunneling microscopy
 
 
Title: Transmission electron microscopy observation of a single Ni dot fabricated using scanning tunneling microscopy
Author: Hong, Chul-Un
Kang, Hyung-Sub
Kim, Seong-Jong
Kang, Sung-Jun
Kim, Gi-Beum
Appeared in: International journal of precision engineering and manufacturing
Paging: Volume 11 (2010) nr. 3 pages 469-472
Year: 2010
Contents:
Publisher: Korean Society for Precision Engineering, Springer
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 17 of 17 found articles
 
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