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Journal description
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Details for article 2 of 28 found articles
| Title: |
Covalence of chemical bonds and white-line intensity of an L3-edge X-ray absorption near-edge structure of rare earth elements embedded in glass |
| Author: |
Choi, Yong Gyu |
| Appeared in: |
Metals and materials international |
| Paging: | Volume 15 (2009) nr. 6 pages 993-999 |
| Year: |
2009 |
| Contents: | |
| Publisher: |
The Korean Institute of Metals and Materials, Springer |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 28 found articles
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