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Solder joint reliability in flip chip package with surface treatment of ENIG under thermal shock test |
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Titel: |
Solder joint reliability in flip chip package with surface treatment of ENIG under thermal shock test |
Auteur: |
Ha, Sang-Su Ha, Sang-Ok Yoon, Jeong-Won Kim, Jong-Woong Ko, Min-Kwan Kim, Dae-Gon Kim, Sung-Jin Hong, Tae-Hwan Jung, Seung-Boo |
Verschenen in: |
Metals and materials international |
Paginering: |
Jaargang 15 (2009) nr. 4 pagina's 655-660 |
Jaar: |
2009 |
Inhoud: |
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Uitgever: |
The Korean Institute of Metals and Materials, Springer |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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