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                                       Details for article 14 of 17 found articles
 
 
  Structural noise from automatic exposure control device and its relationship to X-ray tube voltage used for calibration of a flat-panel detector system
 
 
Title: Structural noise from automatic exposure control device and its relationship to X-ray tube voltage used for calibration of a flat-panel detector system
Author: Mizuta, Masayoshi
Akazawa, Hiroyuki
Kasai, Toshifumi
Sanada, Shigeru
Abe, Shuji
Mitou, Shigeki
Appeared in: Radiological physics and technology
Paging: Volume 5 (2011) nr. 1 pages 20-26
Year: 2011
Contents:
Publisher: Springer Japan, Japan
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 14 of 17 found articles
 
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