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                                       Details for article 9 of 25 found articles
 
 
  Fail Safe Process of Vehicle Localization for Reliability Improvement of LV3 Autonomous Driving
 
 
Title: Fail Safe Process of Vehicle Localization for Reliability Improvement of LV3 Autonomous Driving
Author: Seo, Kyungil
Lee, Jaehoon
Lee, Je-young
Yi, Kyongsu
Appeared in: International journal of automotive technology
Paging: Volume 22 () nr. 2 pages 529-535
Year: 2021-04-02
Contents:
Publisher: The Korean Society of Automotive Engineers, Seoul
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 25 found articles
 
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