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Journal description
All volumes of the corresponding journal
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Details for article 10 of 15 found articles
| Title: |
ONP Spectroscopy of Defects in Silicon |
| Author: |
Bagraev, N. T. Polovtsev, I. S. |
| Appeared in: |
Applied magnetic resonance |
| Paging: | Volume 40 (2011) nr. 3 pages 387-393 |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Springer Vienna, Vienna |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 15 found articles
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