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Van der Waals integration inch-scale 2D MoSe2 layers on Si for highly-sensitive broadband photodetection and imaging |
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Titel: |
Van der Waals integration inch-scale 2D MoSe2 layers on Si for highly-sensitive broadband photodetection and imaging |
Auteur: |
Wu, Yupiao Wu, Shuo-En Hei, Jinjin Zeng, Longhui Lin, Pei Shi, Zhifeng Chen, Qingming Li, Xinjian Yu, Xuechao Wu, Di |
Verschenen in: |
Nano research |
Paginering: |
Jaargang 16 () nr. 8 pagina's 11422-11429 |
Jaar: |
2023-06-08 |
Inhoud: |
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Uitgever: |
Tsinghua University Press, Beijing |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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